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Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing

Gold Plated Spring Test Probe

2A Current Rating Test Probe

Custom Sizes Semiconductor Test Pin

원래 장소:

중국

브랜드 이름:

WINNER

인증:

ISO9100

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제품 상세정보
제품명:
스프링 테스트 프로브
통:
PB, 골드팔티드
하단 플런저:
BeCu/SK4, 금도금
TOP 플런저:
SK4(Be Cu)/금도금
봄:
SWPB(SUS)/금도금
유효성:
사용 가능한 맞춤형 크기
코팅:
금도금
현재 등급:
2A
접촉 저항:
최대 100mΩ
대역폭:
-0.44dB @ 19.6GHz
인덕턴스:
1.36nH
용량:
1.76pF
전체 스트로크:
1.8mm
정격 뇌졸중:
1.8mm
전단력:
40그램@1.8mm
기계적 수명 초과:
200k
강조하다:

Gold Plated Spring Test Probe

,

2A Current Rating Test Probe

,

Custom Sizes Semiconductor Test Pin

지불과 운송 용어
최소 주문 수량
3000pcs
가격
999
포장 세부 사항
중성 포장 또는 OEM 로고와 함께
배달 시간
5-8 영업일
지불 조건
L/C, 서부 동맹, T/T
공급 능력
달 당 100000의 목록
제품 설명
High Quality Switch Contact Pin Test Probe YF DE1-048DB81-01C0
High Efficiency BGA Testing Probes
Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.
Key Product Features
  • High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
  • Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
  • Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
  • Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory
Product Images
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 0
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 1
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 2
Detailed Component Illustration
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 3
Comparison of different test probe tip types and configurations
Customization Options
SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:
  • Custom diameters to match your specific requirements
  • Custom plating thicknesses for optimal conductivity and durability
  • Custom mechanical specifications tailored to your application
All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.
Manufacturing Process
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 4
Our probe manufacturing facility
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 5
Quality control inspection
Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for Semiconductor Testing 6
Packaged probes ready for shipment

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